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In situ TEM Approaches to Controlling the Growth of Semiconductors on 2D Materials

Published online by Cambridge University Press:  05 August 2019

Priyanka Periwal ,
Joachim Dahl Thomsen ,
Mark C. Reuter ,
Dmitri Zakharov ,
Lynne Gignac ,
Timothy J. Booth ,
Stephan Hofmann  and
Frances M. Ross
Priyanka Periwal
Affiliation:
Department of Electrical Engineering, University of Cambridge, Cambridge, United Kingdom IBM T. J. Watson Research Center, Yorktown Heights, New York, USA
Joachim Dahl Thomsen
Affiliation:
Center for Nanostructured Graphene, Department of Micro- and Nanotechnology, Technical University of Denmark, Kongens Lyngby, Denmark
Mark C. Reuter
Affiliation:
IBM T. J. Watson Research Center, Yorktown Heights, New York, USA
Dmitri Zakharov
Affiliation:
Center for Functional Nanomaterials, Brookhaven National Laboratory, Upton, New York, USA
Lynne Gignac
Affiliation:
IBM T. J. Watson Research Center, Yorktown Heights, New York, USA
Timothy J. Booth
Affiliation:
Center for Nanostructured Graphene, Department of Micro- and Nanotechnology, Technical University of Denmark, Kongens Lyngby, Denmark
Stephan Hofmann*
Affiliation:
Department of Electrical Engineering, University of Cambridge, Cambridge, United Kingdom
Frances M. Ross*
Affiliation:
IBM T. J. Watson Research Center, Yorktown Heights, New York, USA Current address: Department of Materials Science and Engineering, Massachusetts Institute of Technology, Cambridge, Massachusetts, USA
*
*Corresponding authors: fmross@mit.edu, sh315@cam.ac.uk
*Corresponding authors: fmross@mit.edu, sh315@cam.ac.uk

Abstract

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Type
In situ TEM Characterization of Dynamic Processes During Materials Synthesis and Processing
Information
Microscopy and Microanalysis , Volume 25 , Supplement S2 , August 2019 , pp. 1424 - 1425
Copyright
Copyright © Microscopy Society of America 2019 

References

[1]Koma., A, Van der Waals epitaxy of lattice-mismatched systems, Journal of Crystal Growth 201 (1999) 236.Google Scholar
[2]Xu., Y, Cheng., C, Du., S, Yang., J, Yu., B, Luo., J, Yin., W, Li., E, Dong., S, Ye., P, Duan., X, Contacts between Two- and Three-Dimensional Materials: Ohmic, Schottky and p-n heterojunctions, ACS Nano 10 (2016) 4895.Google Scholar
[3]We acknowledge financial support from the EPSRC (EP/K016636/1) and ERC (Grant 279342: InSituNANO) (PP, SH) and the Center for Functional Nanomaterials, Brookhaven National Laboratory, which is supported by the U.S. Department of Energy, Office of Basic Energy Sciences, under contract DE-AC02-98CH10886 (DZ). We also acknowledge Dr Mark C. Reuter and Arthur W. Ellis of IBM for their invaluable technical support.Google Scholar