Hostname: page-component-77c89778f8-vsgnj Total loading time: 0 Render date: 2024-07-20T08:00:57.291Z Has data issue: false hasContentIssue false
  • English
  • Français

In Situ Ferroelectric Domain Dynamics Probed with Differential Phase Contrast Imaging

Published online by Cambridge University Press:  05 August 2019

Abinash Kumar ,
Rohan Dhall  and
James M. LeBeau
Abinash Kumar
Affiliation:
Department of Materials Science and Engineering, North Carolina State University, Raleigh, NC, USA
Rohan Dhall
Affiliation:
National Center for Electron Microscopy, Molecular Foundry, Lawrence Berkeley National Laboratory, Berkeley, CA, USA
James M. LeBeau*
Affiliation:
Department of Materials Science and Engineering, North Carolina State University, Raleigh, NC, USA
*
*Corresponding author: lebeau@mit.edu

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
In situ TEM of Nanoscale Materials and Electronic Devices for Phase Transformation Studies
Information
Microscopy and Microanalysis , Volume 25 , Supplement S2 , August 2019 , pp. 1838 - 1839
Copyright
Copyright © Microscopy Society of America 2019 

References

[1]Li, F. et al. , Nature Materials 17 (2018), p. 349.Google Scholar
[2]Li, F. et al. , Nature Communications 7 (2016), p. 13807.Google Scholar
[3]Takenaka, H. et al. , Nature 546 (2017), p.391.Google Scholar
[4]Shibata, N. et al. , Nature Physics 8 (2012), p. 611.Google Scholar
[5]Sang, X. and LeBeau, J. M., Ultramicroscopy 138 (2014), p.28.Google Scholar
[6]This material is based upon work supported by the National Science Foundation, as part of the Center for Dielectrics and Piezoelectrics under Grant Nos. IIP-1361571 and IIP-1361503.Google Scholar