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In situ Femtosecond Laser and Argon Ion Beams for 3D Microanalysis using the TriBeam

Published online by Cambridge University Press:  23 September 2015

M.P. Echlin ,
W.C. Lenthe ,
J. Douglas ,
M. Titus ,
R. Guerts ,
M. Straw  and
T.M. Pollock
M.P. Echlin
Affiliation:
Materials Department, University California at Santa Barbara, Santa Barbara, USA
W.C. Lenthe
Affiliation:
Materials Department, University California at Santa Barbara, Santa Barbara, USA
J. Douglas
Affiliation:
Materials Department, University California at Santa Barbara, Santa Barbara, USA
M. Titus
Affiliation:
Materials Department, University California at Santa Barbara, Santa Barbara, USA
R. Guerts
Affiliation:
FEI Company
M. Straw
Affiliation:
FEI Company
T.M. Pollock
Affiliation:
Materials Department, University California at Santa Barbara, Santa Barbara, USA

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 21 , Supplement S3: Proceedings of Microscopy & Microanalysis 2015 , August 2015 , pp. 1847 - 1848
Copyright
Copyright © Microscopy Society of America 2015 

References

References:

[1] Ma, S., et al, Met. Mat. Trans. A 38 (2007). p 2349–2357.Google Scholar
[2] Feng, Q., et al, Scripta Mat 53(5 (2005). p 511–516.Google Scholar
[3] Echlin, M.P., et al, Materials Characterization: Tutorial Review 100 (2015) 1–12.Google Scholar
[4] Giannuzzi, L.A., et al, Microscopy and Microanalysis 11 (2005) 828–829.Google Scholar