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In situ Correlative Helium Ion Microscopy and Secondary Ion Mass Spectrometry for High-Resolution Nano-Analytics in Life Sciences

Published online by Cambridge University Press:  05 August 2019

Jelena Lovric*
Affiliation:
Advanced Instrumentation for Ion Nano-Analytics, Department of Materials Research and Technology, Luxembourg Institute of Science and Technology (LIST), Belvaux, Luxembourg.
Jean-Nicolas Audinot
Affiliation:
Advanced Instrumentation for Ion Nano-Analytics, Department of Materials Research and Technology, Luxembourg Institute of Science and Technology (LIST), Belvaux, Luxembourg.
Tom Wirtz
Affiliation:
Advanced Instrumentation for Ion Nano-Analytics, Department of Materials Research and Technology, Luxembourg Institute of Science and Technology (LIST), Belvaux, Luxembourg.
*
*Corresponding author: jelena.lovric@list.lu

Abstract

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Type
Multi-Modal, Large-Scale and 3D Correlative Microscopy
Copyright
Copyright © Microscopy Society of America 2019 

References

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[2]Wirtz, T, Dowsett, D and Philipp, P in “SIMS on the Helium Ion Microscope: A Powerful Tool for High-Resolution High-Sensitivity Nano-Analytics”. In: Hlawacek, G.Gölzhäuser, , A. (eds) Helium Ion Microscopy (Springer, Cham) p. 297.Google Scholar
[3]Wirtz, T et al. , Nanotechnology 26 (2015), p. 434001.Google Scholar
[4]Dowsett, D and Wirtz, T, Analytical Chemistry 89 (2017), p. 8957.Google Scholar
[5]Wirtz, T et al. , Ann Rev of Analytical Chemistry 12 (2019).Google Scholar
[6]Vollnhals, F et al. , Analytical Chemistry 89 (2017), p. 10702.Google Scholar
[8]This project has received funding from the European Union's Horizon 2020 Research and Innovation Programme under grant agreement No. 720964. The authors kindly acknowledge M. Mercier-Bonin, Toxalim, France, P. Chlanda, University Hospital Heidelberg, Germany and S. Jiang and X. Rovira-Clave, Stanford University, USA for providing biological samples.Google Scholar