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In situ Cathodoluminescence and Monitoring Electronic Structure Change Using Optical TEM Holder

Published online by Cambridge University Press:  05 August 2019

Mingjie Xu ,
Sheng Dai ,
Wenpei Gao ,
Thomas Blum  and
Xiaoqing Pan
Mingjie Xu
Affiliation:
Department of Materials Science and Engineering, University of California-Irvine, Irvine, CA, USA. Irvine Materials Research Institute, University of California-Irvine, Irvine, CA, USA.
Sheng Dai
Affiliation:
Department of Materials Science and Engineering, University of California-Irvine, Irvine, CA, USA.
Wenpei Gao
Affiliation:
Department of Materials Science and Engineering, University of California-Irvine, Irvine, CA, USA.
Thomas Blum
Affiliation:
Department of Physics and Astronomy, University of California-Irvine, Irvine, CA, USA.
Xiaoqing Pan
Affiliation:
Department of Materials Science and Engineering, University of California-Irvine, Irvine, CA, USA. Irvine Materials Research Institute, University of California-Irvine, Irvine, CA, USA. Department of Physics and Astronomy, University of California-Irvine, Irvine, CA, USA.

Abstract

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Type
The Success of TMBA: TEM and STEM Developments in Techniques, Applications and Education
Information
Microscopy and Microanalysis , Volume 25 , Supplement S2 , August 2019 , pp. 2302 - 2303
Copyright
Copyright © Microscopy Society of America 2019 

References

[1]Xu, M et al. , Ultramicroscopy 192 (2018), p.1.Google Scholar
[2]This work was supported by the Department of Energy (DOE) under Grant DE-SC0014430 and by the National Science Foundation under Grant DMR-1506535. TEM experiments were conducted in the Irvine Materials Research Institute (IMRI) at the University of California-Irvine.Google Scholar