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Improving the Spatial and Energy Resolution of Aberration-Corrected STEM

Published online by Cambridge University Press:  08 April 2017

O Krivanek ,
N Dellby ,
M Murfitt ,
N Bacon ,
G Corbin ,
P Hrncirik ,
J Nelson ,
T Lovejoy ,
G Skone  and
Z Szilagyi
O Krivanek
Affiliation:
Nion Co
N Dellby
Affiliation:
Nion Co
M Murfitt
Affiliation:
Nion Co
N Bacon
Affiliation:
Nion Co
G Corbin
Affiliation:
Nion Co
P Hrncirik
Affiliation:
Nion Co
J Nelson
Affiliation:
Nion Co
T Lovejoy
Affiliation:
Nion Co
G Skone
Affiliation:
Nion Co
Z Szilagyi
Affiliation:
Nion Co

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Type
Abstract
Information
Microscopy and Microanalysis , Volume 17 , Supplement S2 , July 2011 , pp. 1290 - 1291
Copyright
Copyright © Microscopy Society of America 2011