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Improving EPMA Analyses Using Mean Atomic Number Backgrounds

Published online by Cambridge University Press:  08 April 2017

D Wark  and
J Donovan
D Wark
Affiliation:
GE Global Research
J Donovan
Affiliation:
CAMCOR, University of Oregon

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Type
Abstract
Information
Microscopy and Microanalysis , Volume 17 , Supplement S2 , July 2011 , pp. 580 - 581
Copyright
Copyright © Microscopy Society of America 2011