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Improved Data Analysis with IVAS 4 and AP Suite

Published online by Cambridge University Press:  05 August 2019

D.A. Reinhard ,
T.R. Payne ,
E.M. Strennen ,
E. Oltman ,
B.P. Geiser ,
G.S. Sobering  and
J. Mandt
D.A. Reinhard*
Affiliation:
CAMECA Instruments Inc., 5470 Nobel Drive, Madison, WI 53711USA.
T.R. Payne
Affiliation:
CAMECA Instruments Inc., 5470 Nobel Drive, Madison, WI 53711USA.
E.M. Strennen
Affiliation:
CAMECA Instruments Inc., 5470 Nobel Drive, Madison, WI 53711USA.
E. Oltman
Affiliation:
CAMECA Instruments Inc., 5470 Nobel Drive, Madison, WI 53711USA.
B.P. Geiser
Affiliation:
CAMECA Instruments Inc., 5470 Nobel Drive, Madison, WI 53711USA.
G.S. Sobering
Affiliation:
CAMECA Instruments Inc., 5470 Nobel Drive, Madison, WI 53711USA.
J. Mandt
Affiliation:
CAMECA Instruments Inc., 5470 Nobel Drive, Madison, WI 53711USA.
*
*Corresponding author: David.reinhard@ametek.com

Abstract

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Type
Recent Developments in Atom Probe Tomography
Information
Microscopy and Microanalysis , Volume 25 , Supplement S2 , August 2019 , pp. 302 - 303
Copyright
Copyright © Microscopy Society of America 2019 

References

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