Hostname: page-component-5c6d5d7d68-ckgrl Total loading time: 0 Render date: 2024-08-19T00:42:06.320Z Has data issue: false hasContentIssue false
  • English
  • Français

Imaging Point Defects in Complex Oxides Using Quantitative STEM

Published online by Cambridge University Press:  04 August 2017

Honggyu Kim ,
Jack Y. Zhang  and
Susanne Stemmer
Honggyu Kim
Affiliation:
Materials Department, University of California, Santa Barbara, USA.
Jack Y. Zhang
Affiliation:
Materials Department, University of California, Santa Barbara, USA.
Susanne Stemmer
Affiliation:
Materials Department, University of California, Santa Barbara, USA.

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 23 , Supplement S1: Proceedings of Microscopy & Microanalysis 2017 , July 2017 , pp. 1568 - 1569
Copyright
© Microscopy Society of America 2017 

References

[1] Hwang, J., et al, Phys. Rev. Lett. 111 2013 266101.Google Scholar
[2] Zhang, J. Y., et al, Sci. Rep. 5 2015 12419.Google Scholar
[3] Kim, H., et al, Phys. Rev. X 6 2016 041063.Google Scholar
[4] The authors acknowledge support by the U.S. Department of Energy (Grant No. DEFG02-02ER45994).Google Scholar