Hostname: page-component-77c89778f8-m42fx Total loading time: 0 Render date: 2024-07-17T13:01:41.584Z Has data issue: false hasContentIssue false
  • English
  • Français

Imaging of GaAs Nanowire Using Combined Aberration-corrected TEM/STEM and Exit Wave Restoration

Published online by Cambridge University Press:  26 July 2009

L-Y Chang ,
S Lazar ,
B Bártová ,
GA Botton ,
C Hébert  and
A Fontcuberta i Morral
L-Y Chang
Affiliation:
McMaster University,Canada
S Lazar
Affiliation:
FEI Company,Netherlands
B Bártová
Affiliation:
École Polytechnique Fédérale de Lausanne,Switzerland
GA Botton
Affiliation:
McMaster University,Canada
C Hébert
Affiliation:
École Polytechnique Fédérale de Lausanne,Switzerland
A Fontcuberta i Morral
Affiliation:
École Polytechnique Fédérale de Lausanne,Switzerland

Extract

Core share and HTML view are not available for this content. However, as you have access to this content, a full PDF is available via the ‘Save PDF’ action button.

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

Type
Abstract
Information
Microscopy and Microanalysis , Volume 15 , Supplement S2 , July 2009 , pp. 138 - 139
Copyright
Copyright © Microscopy Society of America 2009