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Imaging and Spectroscopy of Interfaces and Surfaces with Advanced Electron Microscopy

Published online by Cambridge University Press:  01 August 2010

Y Zhu ,
H Inada ,
D Su ,
L Wu ,
J Ciston ,
C Jooss ,
J Norpoth  and
J Wall
Y Zhu
Affiliation:
Brookhaven National Laboratory
H Inada
Affiliation:
Hitachi High Technologies, Japan
D Su
Affiliation:
Brookhaven National Laboratory
L Wu
Affiliation:
Brookhaven National Laboratory
J Ciston
Affiliation:
Brookhaven National Laboratory
C Jooss
Affiliation:
University of Göttingen, Germany
J Norpoth
Affiliation:
University of Göttingen, Germany
J Wall
Affiliation:
Brookhaven National Laboratory

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Type
Abstract
Information
Microscopy and Microanalysis , Volume 16 , Supplement S2 , July 2010 , pp. 1430 - 1431
Copyright
Copyright © Microscopy Society of America 2010