Hostname: page-component-848d4c4894-xm8r8 Total loading time: 0 Render date: 2024-06-30T18:41:50.380Z Has data issue: false hasContentIssue false
  • English
  • Français

Identification of Halogen Atoms in Scanning Tunneling Microscopy Images of Substituted Phenyloctadecyl Ethers

Published online by Cambridge University Press:  02 July 2020

I. H. Musselman ,
H. S. Lee  and
S. Iyengar
I. H. Musselman
Affiliation:
Department of Chemistry, Department of Chemistry, University of Texas at Dallas, Richardson, TX75083-0688
H. S. Lee
Affiliation:
Department of Chemistry, Department of Chemistry, University of Texas at Dallas, Richardson, TX75083-0688
S. Iyengar
Affiliation:
Department of Chemistry, Department of Chemistry, University of Texas at Dallas, Richardson, TX75083-0688
Get access

Extract

Numerous scanning tunneling microscopy (STM) studies of organic adsorbates at the gas/solid and liquid/solid interfaces have been reported. Although early STM experiments of these systems were concerned primarily with visualizing molecules at the atomic level, the focus has shifted to extracting chemical information from STM images, including the identity of atoms or functional groups within an adsorbed molecule. However, STM image interpretation continues to be an immense challenge and one currently debated issue of critical importance is the mechanism(s) by which image contrast reveals atomic and molecular structure. Recently, a combination of electronic and geometric factors was proposed. The electronic factor addresses the coupling between the energy levels of the adsorbate and the Fermi level of the surface whereas the geometric factor is related to the spatial overlap between the STM tip and the functional group.

A study in our laboratory of a homologous series of para-halogenated phenyloctadecyl ethers (XPOEs, where X = H, Cl, Br, I) adsorbed on highly oriented pyrolytic graphite (HOPG) has contributed significantly to the understanding of the image contrast mechanism for molecular adsorbates and of the chemical specificity of STM.

Type
Scanned Probe Microscopy: Much More Than Just Beautiful Images
Information
Microscopy and Microanalysis , Volume 5 , Issue S2: Proceedings: Microscopy & Microanalysis '99, Microscopy Society of America 57th Annual Meeting, Microbeam Analysis Society 33rd Annual Meeting, Portland, Oregon August 1-5, 1999 , August 1999 , pp. 966 - 967
Copyright
Copyright © Microscopy Society of America

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1.Frommer, J., Angew. Chem. Int. Ed. Engl. 31 (1992) 1298.CrossRefGoogle Scholar
2.Rabe, J. P., Ultramicroscopy 42–44 (1992) 41.Google Scholar
3.Delamarche, E. et al., Adv. Mater. 8 (1996) 719.CrossRefGoogle Scholar
4.Cyr, D. M., Venkataraman, B., and Flynn, G. W., Chem. Mater. 8 (1996) 1600.CrossRefGoogle Scholar
5.Chiang, S., Chem. Rev. 97 (1997) 1083.CrossRefGoogle Scholar
6.Giancarlo, L. C. and Flynn, G. W., Annu. Rev. Phys. Chem. 49 (1998) 297.CrossRefGoogle Scholar
7.Boland, J. J. and Villarrubia, J. S, Science 248 (1990) 838.CrossRefGoogle Scholar
8.Hossick Schott, J. and White, H. S., Langmuir 10 (1994) 486.CrossRefGoogle Scholar
9.Hossick Schott, J. and White, H. S., J. Phys. Chem. 98 (1994) 291.CrossRefGoogle Scholar
10.Hossick Schott, J. and White, H. S., J. Phys. Chem. 98 (1994) 297.CrossRefGoogle Scholar
11.Spence, J. C. H., Weierstall, U., and Lo, W., J. Vac. Sci. Technol. B 14 (1996) 1587.CrossRefGoogle Scholar
12.Sautet, P., Surf. Sci. 374 (1997) 406.CrossRefGoogle Scholar
13.Voigtlander, B. et al., Phys. Rev. B 55 (1997) R13444.CrossRefGoogle Scholar
14.Venkataraman, B. et al., J. Phys. Chem. 99 (1995) 8684.CrossRefGoogle Scholar
15.Cyr, D. et al., J. Phys. Chem. 100 (1996) 13747.CrossRefGoogle Scholar
16.Claypool, C. L. et al., J. Phys. Chem. B 101 (1997) 5978.CrossRefGoogle Scholar
17.Faglioni, F. et al., J. Phys. Chem. B 101 (1997) 5996.CrossRefGoogle Scholar
18.Giancarlo, L. et al., Langmuir 14 (1998) 1465.CrossRefGoogle Scholar
19.Spong, J. K. et al., Nature 338 (1989) 137.CrossRefGoogle Scholar
20.Smith, D. P. E. et al., Nature 344 (1990) 641.CrossRefGoogle Scholar
21.Mizutani, W. et al., Appl. Phys. Lett. 56 (1990) 1974.CrossRefGoogle Scholar
22.Lee, H. S., Iyengar, S. and Musselman, I. H., Langmuir 14 (1998) 7475.CrossRefGoogle Scholar
23. The support of this research by a grant from the Robert A. Welch Foundation is gratefully acknowledged.Google Scholar