Hostname: page-component-76fb5796d-9pm4c Total loading time: 0 Render date: 2024-04-26T17:56:47.412Z Has data issue: false hasContentIssue false
  • English
  • Français

High-Resolution Full-Field X-ray Microscope for 20-keV X-rays with Multilayer Imaging Mirrors

Published online by Cambridge University Press:  10 August 2018

Satoshi Matsuyama ,
Jumpei Yamada ,
Kentaro Hata ,
Yoshiki Kohmura ,
Makina Yabashi ,
Tetsuya Ishikawa  and
Kazuto Yamauchi
Satoshi Matsuyama*
Affiliation:
Department of Precision Science and Technology, Graduate School of Engineering, Osaka University, 2-1 Yamada-oka, Suita, Osaka565-0871, Japan
Jumpei Yamada
Affiliation:
Department of Precision Science and Technology, Graduate School of Engineering, Osaka University, 2-1 Yamada-oka, Suita, Osaka565-0871, Japan
Kentaro Hata
Affiliation:
Department of Precision Science and Technology, Graduate School of Engineering, Osaka University, 2-1 Yamada-oka, Suita, Osaka565-0871, Japan
Yoshiki Kohmura
Affiliation:
SPring-8/RIKEN, 1-1-1 Kouto, Sayo, Hyogo679-5198, Japan
Makina Yabashi
Affiliation:
SPring-8/RIKEN, 1-1-1 Kouto, Sayo, Hyogo679-5198, Japan
Tetsuya Ishikawa
Affiliation:
SPring-8/RIKEN, 1-1-1 Kouto, Sayo, Hyogo679-5198, Japan
Kazuto Yamauchi
Affiliation:
Department of Precision Science and Technology, Graduate School of Engineering, Osaka University, 2-1 Yamada-oka, Suita, Osaka565-0871, Japan
*
*Corresponding author, matsuyama@prec.eng.osaka-u.ac.jp

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 24 , Supplement S2: Proceedings of the 14th International Conference on X-ray Microscopy (XRM2018) , August 2018 , pp. 284 - 285
Copyright
© Microscopy Society of America 2018 

References

[1] Matsuyama, S., et al, Sci. Rep. 7, 46358 2017.CrossRefGoogle Scholar
[2] Kim, J., et al, Opt. Express 23, 29032 2015.Google Scholar
[3] Yamada, J., et al, Appl. Opt. 56, 967 2017.Google Scholar