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High Spatial Resolution Soft X-Ray Microscopy and Microanalysis of Thick and Hydrated Materials

Published online by Cambridge University Press:  02 July 2020

W. Meyer-Ilse
Affiliation:
Center for X-ray Optics, Lawrence Berkeley National Laboratory, Berkeley, CA, 94720
J. T. Brown
Affiliation:
Center for X-ray Optics, Lawrence Berkeley National Laboratory, Berkeley, CA, 94720
C. Magowan
Affiliation:
Life Sciences Division, Lawrence Berkeley National Laboratory, Berkeley, CA, 94720
J. Yeung
Affiliation:
Life Sciences Division, Lawrence Berkeley National Laboratory, Berkeley, CA, 94720
K. E. Kurtis
Affiliation:
Dept. for Civil and Environmental Engineering, University of California, Berkeley, CA, 94720
P. Monteiro
Affiliation:
Dept. for Civil and Environmental Engineering, University of California, Berkeley, CA, 94720
B. P. Tonner
Affiliation:
Dept. of Physics, University of Wisconsin-Milwaukee, WI, 53201
K. Nealson
Affiliation:
Dept. of Physics, University of Wisconsin-Milwaukee, WI, 53201
S. Lelièvre
Affiliation:
Life Sciences Division, Lawrence Berkeley National Laboratory, Berkeley, CA, 94720
C. Larabell
Affiliation:
Center for X-ray Optics, Lawrence Berkeley National Laboratory, Berkeley, CA, 94720
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Extract

The Center for X-ray Optics (CXRO) built and operates a high-resolution soft x-ray microscope (XM-1) at the Advanced Light Source in Berkeley. We report on the use of this instrument in a variety of scientific fields, including biology, civil engineering and environmental sciences.

The microscope is a conventional (full field) x-ray microscope, which uses zone plate lenses to provide high resolution transmission images. The optical setup is similar to the Göttingen x-ray microscope, operated at the BESSY synchrotron radiation facility in Berlin, Germany. A condenser zone plate, fabricated by the Göttingen group, is illuminating the sample and an objective zone plate, fabricated by Erik Anderson (CXRO), is forming an enlarged image on an x-ray CCD camera. While the optical path of the microscope is in vacuum, the sample is at atmospheric pressure, flushed by helium. The spatial resolution of our microscope is 43 nm, measured as the distance from 10%-90% intensity in the image of a knife-edge.

Type
Novel X-Ray Methods: From Microscopy to Ultimate Detectability
Copyright
Copyright © Microscopy Society of America

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References

1.Meyer-Ilse, W. et al., Synchrotron Radiation News, 8(1995) 2933.CrossRefGoogle Scholar
2.Schneider, G. et al. in: Thieme, J. et al., X-ray Microscopy and Spectromicroscopy, Springer, Heidelberg, (1998).Google Scholar
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6. This work is supported by the Office of Basic Energy Sciences and the Office of Biological and Environmental Research at the U.S. Department of Energy, the Laboratory Directed Research and Development Program at LBNL, the Laboratory for Surface Science, and Center for Great Lakes Studies.Google Scholar