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High Resolution S/TEM Study of Defects in MOCVD Grown Mono to Few Layer WS2

Published online by Cambridge University Press:  01 August 2018

Saiphaneendra Bachu ,
Danielle Reifsnyder Hickey ,
Tanushree H Choudhury ,
Mikhail Chubarov ,
Joan M Redwing  and
Nasim Alem
Saiphaneendra Bachu
Affiliation:
Department of Materials Science and Engineering, The Pennsylvania State University, UniversityPark, USA.
Danielle Reifsnyder Hickey
Affiliation:
Department of Materials Science and Engineering, The Pennsylvania State University, UniversityPark, USA.
Tanushree H Choudhury
Affiliation:
2D Crystal Consortium, Materials Research Institute, The Pennsylvania State University, UniversityPark, USA.
Mikhail Chubarov
Affiliation:
2D Crystal Consortium, Materials Research Institute, The Pennsylvania State University, UniversityPark, USA.
Joan M Redwing
Affiliation:
Department of Materials Science and Engineering, The Pennsylvania State University, UniversityPark, USA. 2D Crystal Consortium, Materials Research Institute, The Pennsylvania State University, UniversityPark, USA.
Nasim Alem
Affiliation:
Department of Materials Science and Engineering, The Pennsylvania State University, UniversityPark, USA. 2D Crystal Consortium, Materials Research Institute, The Pennsylvania State University, UniversityPark, USA.

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 24 , Supplement S1: Proceedings of Microscopy & Microanalysis 2018 , August 2018 , pp. 1636 - 1637
Copyright
© Microscopy Society of America 2018 

References

[1] Jariwala, Deep, et al, ACS nano 8(2 2014) p. 1102.Google Scholar
[2] Zhao, Weijie, et al, ACS nano 7(1 2012) p. 791.Google Scholar
[3] Zhou, Wu, et al, Nano letters 13(6 2013) p. 2615.Google Scholar
[4] Zhang, Xiaotian, et al, Nano letters 2018.Google Scholar
[5] This work was supported by National Science Foundation CAREER AWARD (NSF CAREER grant #424-36 61X4).Google Scholar