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High Resolution Microscopy with Single Atom Sensitivity using Aberration-Corrected STEM

Published online by Cambridge University Press:  05 August 2007

K van Benthem ,
GS Painter ,
PF Becher ,
CI Contescu ,
NC Gallego  and
S Pennycook
K van Benthem
Affiliation:
Oak Ridge National Laboratory
GS Painter
Affiliation:
Oak Ridge National Laboratory
PF Becher
Affiliation:
Oak Ridge National Laboratory
CI Contescu
Affiliation:
Oak Ridge National Laboratory
NC Gallego
Affiliation:
Oak Ridge National Laboratory
S Pennycook
Affiliation:
Oak Ridge National Laboratory
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Extract

Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

Type
Research Article
Information
Microscopy and Microanalysis , Volume 13 , Issue S02 , August 2007 , pp. 870 - 871
Copyright
© 2007 Microscopy Society of America

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