Hostname: page-component-848d4c4894-xfwgj Total loading time: 0 Render date: 2024-06-29T05:52:27.444Z Has data issue: false hasContentIssue false

High Resolution Fesem Study of Au Particle Growth on TiO2

Published online by Cambridge University Press:  02 July 2020

F. Cosandey
Affiliation:
Department of Ceramic and Materials Engineering, Rutgers University, Piscataway, NJ08855-0909
L. Zhang
Affiliation:
Department of Physics and Astronomy, Rutgers University, Piscataway, NJ08855-0909
T. E. Madey
Affiliation:
Department of Physics and Astronomy, Rutgers University, Piscataway, NJ08855-0909
Get access

Extract

Transition metals supported on oxides have important catalytic properties and are also used in chemical gas sensors for increasing sensitivity and selectivity. In order to understand growth and reactivity in the Au/TiO2 system, we have performed surface studies on a model system consisting of ultrathin, discontinuous Au films on TiO2 (110) single crystals. In this paper we are presenting results obtained by high resolution scanning electron microscopy (HRSEM) on the effects of substrate temperature and average Au thickness on particle size, density and coverage.

The TiO2 (110) single crystal surfaces used in this study were prepared in UHV using surface science tools followed by in-situ Au deposition for different substrate temperatures and for various film thicknesses. After deposition, the samples were transferred in air to the Field Emission Scanning Electron microscope (LEO 982 Gemini) for high resolution imaging.

Typical high resolution scanning electron microscopy (HRSEM) images of Au films deposited at 300 K are shown in Fig. 1 for two film thicknesses of 0.22 and 1.0 nm.

Type
Nanocrystals and Nanocomposites: Novel Structures For Catalysis, Electronics, and Micromechanics
Copyright
Copyright © Microscopy Society of America 1997

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

Haruta, M., Yamada, N., Kobayashi, T. and Iijima, S., J. of Catalysis, 115 (1989) 30110.1016/0021-9517(89)90034-1CrossRefGoogle Scholar
Funazaki, N., et al., Sensors and Actuators, B 13-14 (1993) 53610.1016/0925-4005(93)85080-TCrossRefGoogle Scholar
Diebold, U., Pan, J.-M. and Madey, T. E., Surf. Sei. 331-333 (1995) 845Google Scholar
Cosandey, F., Persaud, R., Zhang, L. and Madey, T. E., MRS Proc. 440 (1997)Google Scholar
Heim, K. R.et al.J. Appl. Phys. 80 (1996) 116110.1063/1.362854CrossRefGoogle Scholar