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High Resolution Electron Microscopy of Grain Boundary Motion During Island Grain Shrinkage

Published online by Cambridge University Press:  25 July 2016

U. Dahmen ,
T. Radetic ,
M.L. Bowers ,
C. Ophus ,
A. Gautam  and
F. Lançon
U. Dahmen
Affiliation:
National Center for Electron Microscopy, Molecular Foundry, LBNL, Berkeley, CA 94720, USA
T. Radetic
Affiliation:
National Center for Electron Microscopy, Molecular Foundry, LBNL, Berkeley, CA 94720, USA Faculty of Technology and Metallurgy, University of Belgrade, Belgrade, Serbia
M.L. Bowers
Affiliation:
National Center for Electron Microscopy, Molecular Foundry, LBNL, Berkeley, CA 94720, USA
C. Ophus
Affiliation:
National Center for Electron Microscopy, Molecular Foundry, LBNL, Berkeley, CA 94720, USA
A. Gautam
Affiliation:
National Center for Electron Microscopy, Molecular Foundry, LBNL, Berkeley, CA 94720, USA
F. Lançon
Affiliation:
Laboratoire de Simulation Atomistique (L_Sim), SP2M, INAC, CEA, 38054 Grenoble, France

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 22 , Supplement S3: Proceedings of Microscopy & Microanalysis 2016 , July 2016 , pp. 1224 - 1225
Copyright
© Microscopy Society of America 2016 

References

[1] Mompiou, F., Legros, M., Radetic, T., Dahmen, U., Gianola, D.S. & Hemker, K.J. Acta Materialia 60 (2012) 2209.Google Scholar
[2] Radetic, T., Ophus, C., Olmsted, D.L., Asta, M. & Dahmen, U. Acta Materialia 60 (2012) 7051.CrossRefGoogle Scholar
[3] Lancon, F., Ye, J., Caliste, D., Radetic, T., Minor, A.M. & Dahmen, U. Nano Lett 10 (2010) 695.Google Scholar
[4] Bowers, M.L., Ophus, C., Gautam, A., Lançon, F. & Dahmen, U. Phys. Rev. Lett., in press.Google Scholar
[5] Work at the NCEM/Molecular Foundry was supported by the Office of Science, Office of Basic Energy Sciences, of the U.S. Department of Energy under Contract No. DE-AC02-05CH11231.Google Scholar