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High Resolution Electron Microscopy of a Novel Zeolite

Published online by Cambridge University Press:  02 July 2020

P.A. Crozier
Affiliation:
Center for Solid State Science, Arizona State University, Tempe, AZ85287-1704
I.Y. Chan
Affiliation:
Chevron Research and Technology Co, Richmond, CA94802
C.Y. Chen
Affiliation:
Chevron Research and Technology Co, Richmond, CA94802
L.W. Finger
Affiliation:
Carnegie Institution of Washington, Geophysical Laboratory, Washington, D.C.20015
R.C. Medrud
Affiliation:
Chevron Research and Technology Co, Richmond, CA94802
T.V. Harris
Affiliation:
Chevron Research and Technology Co, Richmond, CA94802
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Extract

Low-dose high resolution electron microscopy (HREM) is a useful technique for elucidating the structure of zeolites. In recent years a number of zeolite structures have been solved using combinations of different characterization techniques including adsorption measurements, powder x-ray diffraction and low-dose high resolution electron microscopy (for example see ref. 2). We have used these techniques to study the structure of a novel zeolite material. However, great care must be exercised when interpreting data from these techniques in terms of crystal structural units. In this particular case, the structure was recently determined using single crystal x-ray diffraction and showed some surprises.

Details of the synthesis of this zeolite are given elsewhere. The high adsorption capacity suggested that this zeolite possessed two interpenetrating channels (either a 10 and a 12 ring or two 12 ring channels). X-ray powder diffraction showed the material to be monoclinic with a= 18.5Å, b= 13.4 Å, c= 7.6 Å β = 101.5°).

Type
Nanocrystals and Nanocomposites: Novel Structures For Catalysis, Electronics, and Micromechanics
Copyright
Copyright © Microscopy Society of America 1997

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References

Pan, M. and Crozier, P.A., Ultramicroscopy 52(1993)48710.1016/0304-3991(93)90065-6CrossRefGoogle Scholar
Lobo, R. F.et al.Science 262(1993)1543,10.1126/science.262.5139.1543CrossRefGoogle Scholar
Chen, et al.(submitted to Nature )Google Scholar
This work was supported by Chevron Research and Technology Co and HREM Industrial Associates Program of Arizona State University (ASU) and was performed in the Center for HREM at ASLL We would like to thank Dr. Ming Pan of Gatan R&D for helpful discussionsGoogle Scholar