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High Resolution Analysis of Elemental Partitioning in Nickel-Base Superalloy Welds Using Atom Probe Field Ion Microscopy

Published online by Cambridge University Press:  02 July 2020

S. S. Babu ,
S. A. David ,
J. M. Vitek  and
M. K. Miller
S. S. Babu
Affiliation:
Metals and Ceramics Division, Oak Ridge National Laboratory, Oak Ridge, TN 37831-6096.
S. A. David
Affiliation:
Metals and Ceramics Division, Oak Ridge National Laboratory, Oak Ridge, TN 37831-6096.
J. M. Vitek
Affiliation:
Metals and Ceramics Division, Oak Ridge National Laboratory, Oak Ridge, TN 37831-6096.
M. K. Miller
Affiliation:
Metals and Ceramics Division, Oak Ridge National Laboratory, Oak Ridge, TN 37831-6096.
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Extract

Weldability of single-crystal and directionally solidified Ni-base alloys is important for repairwelding of failed components. During welding, phase decomposition and subsequent microstructure development may occur under non-equilibrium conditions. The final microstructure and phase composition of γ and γ' phases in these welds control the weld properties. Previous work used atom-probe field-ion microscopy (APFIM) for characterizing commercial single-crystal alloys. This work summarizes the microstructural development in PWA-1480 [Ni - 11.5 at. % Cr - 11.0% A1 - 5.1% Co - 1.3% W - 1.9% Ti - 4.0% Ta] electron beam (EB) welds and CMSX-4 [Ni - 7.5 at. % Cr - 12.7% A1 - 9.9% Co - 0.38% Mo -2.1% W - 1.3% Ti - 2.2% Ta - 0.95% Re - 0.034% Hf| pulsed laser (PL) welds.

In both PL and EB welds, a dendritic mode of weld solidification was observed.

Type
Imaging and Analysis at the Atomic Level: 30 Years of Atom Probe Field Ion Microscopy
Information
Microscopy and Microanalysis , Volume 4 , Issue S2: Proceedings: Microscopy & Microanalysis '98, Microscopy Society of America 56th Annual Meeting, Microbeam Analysis Society 32nd Annual Meeting, Atlanta, Georgia July 12-16, 1998 , July 1998 , pp. 94 - 95
Copyright
Copyright © Microscopy Society of America

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References

1.David, S. A. et al., Sci. Tech. Weld. Join. 2 (1997) 79.CrossRefGoogle Scholar
2.Miller, M. K. et al., Appl. Surf. Sci. 76/77 (1994) 172.CrossRefGoogle Scholar
3.Blavette, D., Caron, P., and Khan, T., Scr. Metall. 20 (1986) 1395.CrossRefGoogle Scholar
4.Murakami, H., Harada, H., and Bhadeshia, H. K. D. H., Appl. Surf. Sci. 76/77 (1994) 177.CrossRefGoogle Scholar
5. This research was sponsored by the Division of Materials Sciences, U. S. Department of Energy, under contract DE-AC05-960R22464 with Lockheed Martin Energy Research Corporation. This research was conducted utilizing the Shared Research Equipment (SHaRE) User Program facilities at Oak Ridge National Laboratory.Google Scholar