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High Quality Cross Sections of Low Melting Point Samples Prepared with Cryo Ion Slicer - Broad Ar Ion Beam Milling Apparatus with a Newly Developed Specimen Cooling Unit

Published online by Cambridge University Press:  08 April 2017

Y Nakajima ,
M Shibata ,
H Matsushima ,
T Suzuki  and
N Erdman
Y Nakajima
Affiliation:
JEOL Ltd, Japan
M Shibata
Affiliation:
JEOL Ltd, Japan
H Matsushima
Affiliation:
JEOL Ltd, Japan
T Suzuki
Affiliation:
JEOL Ltd, Japan
N Erdman
Affiliation:
JEOL USA

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Type
Abstract
Information
Microscopy and Microanalysis , Volume 17 , Supplement S2 , July 2011 , pp. 1194 - 1195
Copyright
Copyright © Microscopy Society of America 2011