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High Efficiency Phase Contrast Imaging In STEM Using Fast Direct Electron Pixelated Detectors

Published online by Cambridge University Press:  23 September 2015

Hao Yang ,
Lewys Jones ,
Henning Ryll ,
Martin Simson ,
Heike Soltau ,
Yukihito Kondo ,
Ryusuke Sagawa ,
Hiroyuki Banba ,
Timothy J Pennycook  and
Peter D. Nellist
Hao Yang
Affiliation:
University of Oxford, Department of Materials, Parks Rd, Oxford, UK
Lewys Jones
Affiliation:
University of Oxford, Department of Materials, Parks Rd, Oxford, UK
Henning Ryll
Affiliation:
.PNSensor GmbH, Otto-Hahn-Ring 6, 81739 Munchen, Germany
Martin Simson
Affiliation:
.PNDetector GmbH, SckellstraBe 3, 81667 Munchen, Germany
Heike Soltau
Affiliation:
.PNDetector GmbH, SckellstraBe 3, 81667 Munchen, Germany
Yukihito Kondo
Affiliation:
.JEOL Ltd.,3-1-2 Musashino Akishima Tokyo 196-8558 Japan
Ryusuke Sagawa
Affiliation:
.JEOL Ltd.,3-1-2 Musashino Akishima Tokyo 196-8558 Japan
Hiroyuki Banba
Affiliation:
.JEOL Ltd.,3-1-2 Musashino Akishima Tokyo 196-8558 Japan
Timothy J Pennycook
Affiliation:
.Faculty of Physics, University of Vienna, Vienna, Austria
Peter D. Nellist
Affiliation:
University of Oxford, Department of Materials, Parks Rd, Oxford, UK

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 21 , Supplement S3: Proceedings of Microscopy & Microanalysis 2015 , August 2015 , pp. 2303 - 2304
Copyright
Copyright © Microscopy Society of America 2015 

References

[1] Henderson, R. Quarterly Reviews of Biophysics 28, 171–193 (1995).Google Scholar
[2] Rodenburg, J. M., et al., Ultramicroscopy 48, 304–314 (1993).CrossRefGoogle Scholar
[3] Pennycook, T. J., et al. Ultramicroscopy. doi:10.1016/j.ultramic.2014.09.013.CrossRefGoogle Scholar
[4] Yang, H., et al. Ultramicroscopy. doi:10.1016/j.ultramic.2014.10.013.Google Scholar
[5] The authors acknowledge funding from the EPSRC (grant numbers EP/K032518/1 and EP/K040375/1) and the EU Seventh Framework Programme: ESTEEM2..Google Scholar