Crossref Citations
This article has been cited by the following publications. This list is generated based on data provided by
Crossref.
MoberlyChan, Warren J.
Adams, David P.
Aziz, Michael J.
Hobler, Gerhard
and
Schenkel, Thomas
2007.
Fundamentals of Focused Ion Beam Nanostructural Processing: Below, At, and Above the Surface.
MRS Bulletin,
Vol. 32,
Issue. 5,
p.
424.
Mayer, Joachim
Giannuzzi, Lucille A.
Kamino, Takeo
and
Michael, Joseph
2007.
TEM Sample Preparation and FIB-Induced Damage.
MRS Bulletin,
Vol. 32,
Issue. 5,
p.
400.
Yin, K.B.
Xia, Y.D.
Chan, C.Y.
Zhang, W.Q.
Wang, Q.J.
Zhao, X.N.
Li, A.D.
Liu, Z.G.
Bayes, M.W.
and
Yee, K.W.
2008.
The kinetics and mechanism of room-temperature microstructural evolution in electroplated copper foils.
Scripta Materialia,
Vol. 58,
Issue. 1,
p.
65.
Giannuzzi, Lucille A.
Utlaut, Mark
and
Swanson, Lynwood
2008.
EMC 2008 14th European Microscopy Congress 1–5 September 2008, Aachen, Germany.
p.
665.
Wright, Stuart I.
and
Nowell, Matthew M.
2009.
Electron Backscatter Diffraction in Materials Science.
p.
329.
El-Awady, Jaafar A.
Woodward, Christopher
Dimiduk, Dennis M.
and
Ghoniem, Nasr M.
2009.
Effects of focused ion beam induced damage on the plasticity of micropillars.
Physical Review B,
Vol. 80,
Issue. 10,
Simões, S.
Viana, F.
Ramos, A.S.
Vieira, M.T.
and
Vieira, M.F.
2010.
TEM Characterization of As-Deposited and Annealed Ni/Al Multilayer Thin Film.
Microscopy and Microanalysis,
Vol. 16,
Issue. 6,
p.
662.
Giannuzzi, L.A.
and
Utlaut, M.
2011.
Non-monotonic material contrast in scanning ion and scanning electron images.
Ultramicroscopy,
Vol. 111,
Issue. 11,
p.
1564.
Wenk, Hans‐Rudolf
2012.
Modern Diffraction Methods.
p.
173.
Siemons, W.
Beekman, C.
Fowlkes, J. D.
Balke, N.
Tischler, J. Z.
Xu, R.
Liu, W.
Gonzales, C. M.
Budai, J. D.
and
Christen, H. M.
2014.
Focused-ion-beam induced damage in thin films of complex oxide BiFeO3.
APL Materials,
Vol. 2,
Issue. 2,
Punzhin, Sergey
Detsi, Eric
Kuzmin, Alexey
and
De Hosson, Jeff Th. M.
2014.
Deformation of nanoporous nanopillars by ion beam-induced bending.
Journal of Materials Science,
Vol. 49,
Issue. 16,
p.
5598.
Macholdt, Dorothea S.
Förster, Jan-David
Müller, Maren
Weber, Bettina
Kappl, Michael
Kilcoyne, A. L. David
Weigand, Markus
Leitner, Jan
Jochum, Klaus Peter
Pöhlker, Christopher
and
Andreae, Meinrat O.
2019.
Artifacts from manganese reduction in rock samples prepared by focused ion beam (FIB) slicing for X-ray microspectroscopy.
Geoscientific Instrumentation, Methods and Data Systems,
Vol. 8,
Issue. 1,
p.
97.
Wolff, Annalena
2021.
Is the Ne operation of the helium ion microscope suitable for electron backscatter diffraction sample preparation?.
Beilstein Journal of Nanotechnology,
Vol. 12,
Issue. ,
p.
965.
Zhou, Qi
Hu, Rong
and
Sha, Gang
2021.
A new mechanism of surface phase formation on precipitation-hardening alloy under ion irradiation.
Applied Surface Science,
Vol. 563,
Issue. ,
p.
150358.