Hostname: page-component-788cddb947-2s2w2 Total loading time: 0 Render date: 2024-10-11T00:36:36.187Z Has data issue: false hasContentIssue false

From Convergent Beam Electron Diffraction to 4D-STEM: New opportunities for revealing structure at the atomic scale

Published online by Cambridge University Press:  30 July 2021

Joanne Etheridge
Affiliation:
Monash University, Monash University, Victoria, Australia
Wei Chao
Affiliation:
Monash University, United States
Bryan Esser
Affiliation:
Monash University, United States
Weilun Li
Affiliation:
Monash University, Monash University, Australia
Harkirat Mann
Affiliation:
Monash University, Monash University, Victoria, Australia
Timothy Petersen
Affiliation:
Monash University, United States
Changlin Zheng
Affiliation:
Fudan University, United States

Abstract

Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Diffraction Imaging Across Disciplines
Copyright
Copyright © The Author(s), 2021. Published by Cambridge University Press on behalf of the Microscopy Society of America

References

Tanaka, M., Terauchi, M., Tsuda, K., Saitoh, K.: Convergent Beam Electron Diffraction Vols I to IV JEOL Ltd (2002)Google Scholar
Spence, J.C.H. and Zuo, J.M. Electron Microdiffraction: Plenum, New York (1991)Google Scholar
Gjønnes, J. International Tables for Crystallography (2006). Vol. C. ch. 8.8, pp. 735-743 (2006)CrossRefGoogle Scholar
Nakashima, PH, Moodie, AF, Etheridge, J Proceedings of the National Academy of Sciences 110 14144-14149 (2013)CrossRefGoogle Scholar
Guo, Y, Nakashima, P, Etheridge, J IUCrJ 5 753-764 (2018)CrossRefGoogle Scholar
JCH Spence Acta Cryst. A49, 231-260 (1993)CrossRefGoogle Scholar
Battaglia, M, et al. (2010) Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment 622(3):669677.CrossRefGoogle Scholar
Ballabriga, R, et al. (2011) Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment 633:S15S18.CrossRefGoogle Scholar
Ryll, H, et al. (2014) Microscopy and Microanalysis 20(S3) 11221123.CrossRefGoogle Scholar
Tate, MW, et al. (2016) Microscopy and Microanalysis 22 237–24 (2016).CrossRefGoogle Scholar
Ophus, C. Microscopy and Microanalysis 25 563582 (2019)CrossRefGoogle Scholar
Krajnak, M, Etheridge, J Proceedings of the National Academy of Sciences 117 27805-27810 (2020)CrossRefGoogle Scholar