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Fourier Analysis of Ronchigram and Aberration Assessment

Published online by Cambridge University Press:  26 July 2009

K Ishizuka ,
K Kimoto  and
Y Bando
K Ishizuka
Affiliation:
National Institute for Materials Science
K Kimoto
Affiliation:
National Institute for Materials Science
Y Bando
Affiliation:
National Institute for Materials Science

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

Type
Abstract
Information
Microscopy and Microanalysis , Volume 15 , Supplement S2 , July 2009 , pp. 1094 - 1095
Copyright
Copyright © Microscopy Society of America 2009