FIB Target Preparation for 20 kV STEM - A Method for Obtaining Ultra-Thin Lamellas

L Lechner; J Biskupek; U Kaiser

doi:10.1017/S1431927611004016

FIB Target Preparation for 20 kV STEM - A Method for Obtaining Ultra-Thin Lamellas

Published online by Cambridge University Press: 08 April 2017

L Lechner ,

J Biskupek and

U Kaiser

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L Lechner: Affiliation:
Ulm University, Germany
J Biskupek: Affiliation:
Ulm University, Germany
U Kaiser: Affiliation:
Ulm University, Germany

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Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Type: Abstract
Information: Microscopy and Microanalysis , Volume 17 , Supplement S2 , July 2011 , pp. 628 - 629

DOI: https://doi.org/10.1017/S1431927611004016 [Opens in a new window]

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FIB Target Preparation for 20 kV STEM - A Method for Obtaining Ultra-Thin Lamellas

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