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Features of Our SEM Transmission Diffraction Sub-stage with 6-axis Sample Control and a Camera with Variable Camera Length

Published online by Cambridge University Press:  30 July 2020

Johannes Müller ,
Benedikt Haas ,
Wouter Van den Broek ,
Sherjeel Shabih  and
Christoph T. Koch
Johannes Müller
Affiliation:
Humboldt-Universität zu Berlin, Berlin, Berlin, Germany
Benedikt Haas
Affiliation:
Humboldt-Universität zu Berlin, Berlin, Berlin, Germany
Wouter Van den Broek
Affiliation:
Humboldt-Universität zu Berlin, Berlin, Berlin, Germany
Sherjeel Shabih
Affiliation:
Humboldt-Universität zu Berlin, Berlin, Berlin, Germany
Christoph T. Koch
Affiliation:
Humboldt-Universität zu Berlin, Berlin, Berlin, Germany

Abstract

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Type
Four-dimensional Scanning Transmission Electron Microscopy (4D-STEM): New Experiments and Data Analyses for Determining Materials Functionality and Biological Structures
Information
Microscopy and Microanalysis , Volume 26 , Supplement S2 , August 2020 , pp. 1906 - 1907
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Copyright
Copyright © Microscopy Society of America 2020

References

Ophus, C., Microsc. Microanal. 25 (2019) 563Google Scholar
Haas, B., Imaging & Microscopy 21 (2019) 35Google Scholar