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Fast k-Space Mapping of Electronic Bands Using Time-of-Flight Based Cathode-Lens Microspectroscopy.

Published online by Cambridge University Press:  28 September 2015

Gerd Schönhense
Gerd Schönhense*
Affiliation:
Institut für Physik, Johannes Gutenberg-Universität, 55128 Mainz, Germany

Abstract

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Type
Surface Physics Instrumentation
Information
Microscopy and Microanalysis , Volume 21 , Supplement S4: Proceedings Ninth International Conference on Charged Particle Optics , June 2015 , pp. 118 - 123
Copyright
Copyright © Microscopy Society of America 2015 

References

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[21] The author would like to thank all people being involved in the developments discussed in this paper, in particular his coworkers and colleagues K. Medjanik, S. Chernov, D. Kutnyakhov, F. Schertz, D. Panzer, S. A. Nepijko and H. J. Elmers. Thanks are also due to the colleagues in Halle, C. Tusche, A. Krasyuk and J. Kirschner as well as to A. Oelsner (Surface Concept GmbH). Further thanks go to the staff of BESSY (in particular C. Schüssler) and to R. Claessen and M. Scholz (Univ. Wuerzburg) for providing the Bi2Te3 crystal. Financial support by DFG (Scho 341/9) and BMBF (05K12UM2, 05K12EF1 and 05K3UM2) and the center CINEMA, Mainz is gratefully acknowledged.Google Scholar