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Extremely Low Magnification EBSD with an FE-SEM

Published online by Cambridge University Press:  01 August 2010

Y Yamamoto ,
K Ogura ,
K Kawauchi ,
M Shibata ,
N Erdman  and
C Nielsen
Y Yamamoto
Affiliation:
JEOL Ltd
K Ogura
Affiliation:
JEOL Ltd
K Kawauchi
Affiliation:
JEOL Ltd
M Shibata
Affiliation:
JEOL Ltd
N Erdman
Affiliation:
JEOL USA
C Nielsen
Affiliation:
JEOL USA

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Type
Abstract
Information
Microscopy and Microanalysis , Volume 16 , Supplement S2 , July 2010 , pp. 54 - 55
Copyright
Copyright © Microscopy Society of America 2010