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Extensive Analysis of Structure-Property Relationships in Thin-Film Solar Cells Using Scanning Electron Microscopy in Combination with Focused Ion Beam

Published online by Cambridge University Press:  09 October 2013

D. Abou-Ras ,
K. Tsyrulin ,
N. Schäfer ,
M. Nichterwitz ,
H. Kropf ,
S. Harndt ,
R. Caballero ,
H. Schulz  and
F. Bauer
D. Abou-Ras
Affiliation:
K. Tsyrulin
Affiliation:
N. Schäfer
Affiliation:
M. Nichterwitz
Affiliation:
H. Kropf
Affiliation:
S. Harndt
Affiliation:
R. Caballero
Affiliation:
H. Schulz
Affiliation:
F. Bauer
Affiliation:

Abstract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

Type
Abstract
Information
Microscopy and Microanalysis , Volume 19 , Issue S2: Proceedings of Microscopy & Microanalysis 2013 , August 2013 , pp. 1096 - 1097
Copyright
Copyright © Microscopy Society of America 2013