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Exploring Thin Films by Using STEM Techniques in a Dual Beam Workstation

Published online by Cambridge University Press:  31 July 2006

C Holzapfel ,
AF Lasagni ,
G Seiler  and
F Muecklich
C Holzapfel
Affiliation:
Saarland University,Functional Materials,Germany
AF Lasagni
Affiliation:
Saarland University,Functional Materials,Germany
G Seiler
Affiliation:
Saarland University,Functional Materials,Germany
F Muecklich
Affiliation:
Saarland University,Functional Materials,Germany

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

Type
Abstract
Information
Microscopy and Microanalysis , Volume 12 , Issue S02 , August 2006 , pp. 1292 - 1293
Copyright
© 2006 Microscopy Society of America