In today’s laboratory environment, it is important that the performance of analytical instruments be tested and validated. In the past, the testing of infrared micro- spectrometers was based solely upon measuring a signal-to-noise (SNR) ratio of the 100% line. This test is insufficient. It is important to test how well the sample area is defined. In all current commercial infrared spectrometer systems, remote image plane masks are used to define specific areas for infrared spectral analysis. A special test specimen has been developed to evaluate the accuracy of the mask’s ability to define the sample area.

IMS resolution test plates were constructed by photolithographic reproduction of a series geometrically shaped thin polymer films on both infrared transparent windows and gold mirrors. First the surface of the plate is coated with a thin, uniform layer of a photoresist polymer. Then this surface is printed with geometrical patterns such as bands, discs and squares.