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Expanding the capabilities of the RF stroboscopic TEM

Published online by Cambridge University Press:  30 July 2021

June Lau ,
Kayla Callaway ,
Hsin-Yun Chao ,
John Cumings ,
Hyeokmin Choe ,
Eric Montgomery ,
Chunguang Jing  and
Yimei Zhu
June Lau
Affiliation:
National Institute of Standards and Technology, Gaithersburg, Maryland, United States
Kayla Callaway
Affiliation:
Department of Materials Science and Engineering, University of Maryland, College Park, Maryland, United States
Hsin-Yun Chao
Affiliation:
Department of Materials Science and Engineering, University of Maryland, College Park, United States
John Cumings
Affiliation:
Department of Materials Science and Engineering, University of Maryland, College Park, United States
Hyeokmin Choe
Affiliation:
Euclid Techlabs, United States
Eric Montgomery
Affiliation:
Euclid Techlabs, United States
Chunguang Jing
Affiliation:
Euclid Techlabs, United States
Yimei Zhu
Affiliation:
Department of Condensed Matter Physics and Materials Science, Brookhaven National Laboratory, Upton, NY, USA, United States

Abstract

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Type
Fast and Ultrafast Dynamics Using Electron Microscopy
Information
Microscopy and Microanalysis , Volume 27 , Supplement S1 , August 2021 , pp. 2708
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Copyright
Copyright © The Author(s), 2021. Published by Cambridge University Press on behalf of the Microscopy Society of America

References

Jing, C, et al. , Ultramicroscopy, 207 (2019) 112829. DOI: 10.1016/j.ultramic.2019.112829Google Scholar
Lau, J W, et al. , Rev. Sci. Instr. 91 (2020) 021301. DOI:10.1063/1.5131758CrossRefGoogle Scholar
2019 R&D100 Award for “Affordable Laser-free Retrofittable Stroboscopic Solution for Ultra-fast Electron Microscopy“ (R&D 100 Magazine)Google Scholar
2020 Microscopy Innovation Award (Microscopy Today)Google Scholar
Fu, X, et al. , Science Advances, 6 (2020) eabc3456. DOI: 10.1126/sciadv.abc3456CrossRefGoogle Scholar