Hostname: page-component-848d4c4894-xm8r8 Total loading time: 0 Render date: 2024-06-25T11:55:41.118Z Has data issue: false hasContentIssue false
  • English
  • Français

The Examination of Calcium ion Implanted Alumina with Energy Filtered Transmission Electron Microscopy

Published online by Cambridge University Press:  02 July 2020

E.M. Hunt ,
J.M. Hampikian  and
N.D. Evans
E.M. Hunt
Affiliation:
School of Materials Science and Engineering, Georgia Institute of Technology, Atlanta, GA30332-0245
J.M. Hampikian
Affiliation:
School of Materials Science and Engineering, Georgia Institute of Technology, Atlanta, GA30332-0245
N.D. Evans
Affiliation:
Oak Ridge Institute for Science and Education, P.O. Box 117, Oak Ridge, TN37831-0117
Get access

Extract

Ion implantation can be used to alter the optical response of insulators through the formation of embedded nano-sized particles. Single crystal alumina has been implanted at ambient temperature with 50 keV Ca+ to a fluence of 5 x 1016 ions/cm2. Ion channeling, Knoop microhardness measurements, and transmission electron microscopy (TEM) indicate that the alumina surface layer was amorphized by the implant. TEM also revealed nano-sized crystals ≈7 - 8 nm in diameter as seen in Figure 1. These nanocrystals are randomly oriented, and exhibit a face-centered cubic structure (FCC) with a lattice parameter of 0.409 nm ± 0.002 nm. The similarity between this crystallography and that of pure aluminum (which is FCC with a lattice parameter of 0.404 nm) suggests that they are metallic aluminum nanocrystals with a slightly dilated lattice parameter, possibly due to the incorporation of a small amount of calcium.Energy-filtered transmission electron microscopy (EFTEM) provides an avenue by which to confirm the metallic nature of the aluminum involved in the nanocrystals.

Type
Nanocrystals and Nanocomposites: Novel Structures For Catalysis, Electronics, and Micromechanics
Information
Microscopy and Microanalysis , Volume 3 , Issue S2: Proceedings: Microscopy & Microanalysis '97, Microscopy Society of America 55th Annual Meeting, Microbeam Analysis Society 31st Annual Meeting, Histochemical Society 48th Annual Meeting, Cleveland, Ohio, August 10-14, 1997 , August 1997 , pp. 413 - 414
Copyright
Copyright © Microscopy Society of America 1997

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1. Hunt, E.M., Poker, D.B., Hampikian, J.M., Mat. Res. Soc. Symp. Proa, 396, p. 403–410 (1995).CrossRefGoogle Scholar

2. Evans, N., Bentley, J., Zinkle, S.J., Proc. Microscopy and Microanalysis 1995, p. 266–7 (1995).CrossRefGoogle Scholar

3. Ahn, C.C., Krivanek, O.L., “EELS Atlas”, (Gatan Inc., Warrendale, PA and Center for Solid State Science, Arizona State Univ., Tempe, AZ, 1983).Google Scholar

4. Hunt, E.M., Evans, N.D., Hampikian, J.M., Proc. Microscopy and Microanalysis 1996, p.534–35 (1996).CrossRefGoogle Scholar

5. Research sponsored in part by the National Science Foundation under Grant No. DMR-9624927; and the Division of Materials Sciences, U.S. Dept. of Energy, under contract DE-AC05-96OR22464 with Lockheed Martin Energy Research Corp., through the SHaRE Program under the contract DE-AC05-76OR00033 with Oak Ridge Associated Universities; and by the Office of Naval Research through the Molecular Design Institute at Georgia Institute of Technology.Google Scholar