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Evaluation of Optimum Instrument Conditions for the Best Spatial Resolution in Atomic-Column X-ray Analysis toward Quantification
Published online by Cambridge University Press: 30 July 2021
Abstract
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- Type
- Advanced Imaging and Spectroscopy for Nanoscale Materials Characterization
- Information
- Copyright
- Copyright © The Author(s), 2021. Published by Cambridge University Press on behalf of the Microscopy Society of America
References
Pennycook, S.J. & Nellist, P.D. ed. Scanning Transmission Electron Microscopy: Imaging and Analysis, Springer, NY, (2011).CrossRefGoogle Scholar
Williams, D.B. & Carter, C.B.. Transmission Electron Microscopy, 2nd ed. Springer, NY (2009).CrossRefGoogle Scholar
The author wishes to acknowledge financial support from the NSF through grants DMR-2018683 and CMMI-2016279.Google Scholar