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ENZEL - A cryogenic, retrofittable, coincident fluorescence, electron, and ion beam solution for the cryo-electron tomography workflow.

Published online by Cambridge University Press:  30 July 2021

Daan Boltje ,
Jacob Hoogenboom ,
Arjen Jakobi ,
Grant Jensen ,
Caspar Jonker ,
Abraham Koster ,
Mart Last ,
Jürgen Plitzko ,
Stefan Raunser  and
Sebastian Tacke
...Show all authors
Daan Boltje
Affiliation:
Department of Imaging Physics, Delft University of Technology, Lorentzweg 1, 2628CJDelft, The Netherlands, Delft, Netherlands
Jacob Hoogenboom
Affiliation:
Technical University Delft, United States
Arjen Jakobi
Affiliation:
Kavli Institute of Nanoscience, Delft University of Technology, Van der Maasweg 9, 2629 HZ Delft, The Netherlands, United States
Grant Jensen
Affiliation:
Caltech, United States
Caspar Jonker
Affiliation:
Delmic B.V., Kanaalweg 4, 2326 EB Delft, The Netherlands, United States
Abraham Koster
Affiliation:
Department of Cell and Chemical Biology, Leiden University Medical Center, Einthovenweg 20, 2333 ZC Leiden, The Netherlands, United States
Mart Last
Affiliation:
Delmic B.V., Kanaalweg 4, 2326 EB Delft, The Netherlands, United States
Jürgen Plitzko
Affiliation:
Max Planck Institute of Biochemistry, Martinsried, Germany, United States
Stefan Raunser
Affiliation:
Max Planck Institute of Molecular Physiology, United States
Sebastian Tacke
Affiliation:
Department of Structural Biochemistry, Max Planck Institute of Molecular Physiology, Otto-Hahn-Str. 11, 44227Dortmund, Germany, United States
Roger Wepf
Affiliation:
Centre for Microscopy and Microanalysis, The University of Queensland, St. Lucia Queensland 4072, Brisbane, Australia, United States
Sander Den Hoedt
Affiliation:
Delmic B.V., Kanaalweg 4, 2326 EB Delft, The Netherlands, United States

Abstract

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Type
Cryo-electron Tomography: Present Capabilities and Future Potential
Information
Microscopy and Microanalysis , Volume 27 , Supplement S1 , August 2021 , pp. 3228 - 3229
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Copyright
Copyright © The Author(s), 2021. Published by Cambridge University Press on behalf of the Microscopy Society of America

References

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