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Environmental Monitoring During Decommissioning of a CNT Manufacturing Facility Using Polarized Light Microscopy and FE-SEM

Published online by Cambridge University Press:  08 April 2017

E Schumacher ,
S Stoeffler ,
C Schwandt  and
K Diebold
E Schumacher
Affiliation:
McCrone Associates, Inc
S Stoeffler
Affiliation:
McCrone Associates, Inc
C Schwandt
Affiliation:
McCrone Associates, Inc
K Diebold
Affiliation:
McCrone Associates, Inc

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Type
Abstract
Information
Microscopy and Microanalysis , Volume 17 , Supplement S2 , July 2011 , pp. 1534 - 1535
Copyright
Copyright © Microscopy Society of America 2011