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Electrostatic Potential Mapping by Secondary-electron Voltage-contrast and Electron-beam-induced-current in TEM

Published online by Cambridge University Press:  04 August 2017

Myung-Geun Han ,
Joseph A. Garlow  and
Yimei Zhu
Myung-Geun Han
Affiliation:
Condensed Matter Physics & Materials Science, Brookhaven National Laboratory, Upton, NY, USA
Joseph A. Garlow
Affiliation:
Materials Science and Engineering Department, Stony Brook University, Stony Brook, NY, USA
Yimei Zhu
Affiliation:
Condensed Matter Physics & Materials Science, Brookhaven National Laboratory, Upton, NY, USA

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 23 , Supplement S1: Proceedings of Microscopy & Microanalysis 2017 , July 2017 , pp. 1424 - 1425
Copyright
© Microscopy Society of America 2017 

References

[1] McCartney, M. R., et al, Ultramicroscopy 110 2010). p. 375.CrossRefGoogle Scholar
[2] Han, M.-G., et al, Ultramicroscopy 177 2017). p. 14.Google Scholar
[3] This work was supported by the Materials Science and Engineering Divisions, Office of Basic Energy Sciences of the U.S. Department of Energy under Contract No. DESC0012704. Authors are thankful to C. H. Ahn (Yale Univ.), S. S. Wong (Stony Brook Univ.), and S.-W. Cheong (Rutgers Univ.) for their samples.Google Scholar