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Electronic Structure Investigations of γ-Tial.

Published online by Cambridge University Press:  02 July 2020

K. Lie ,
R. Holmestad ,
K. Marthinsen  and
R. Høier
K. Lie
Affiliation:
Department of Physics, Norwegian University of Science and Technology, N-7034Trondheim, Norway
R. Holmestad
Affiliation:
Department of Physics, Norwegian University of Science and Technology, N-7034Trondheim, Norway
K. Marthinsen
Affiliation:
SINTEF Materials Technology, Trondheim, NorwayN-7034
R. Høier
Affiliation:
Department of Physics, Norwegian University of Science and Technology, N-7034Trondheim, Norway
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Extract

The intermetallic compound TiAl is a promising material for applications at high stress and high temperature. It has good balance between lightness, strength and oxidation resistance, but suffers of an intrinsic brittleness at lower temperature. Small, ternary additions of V, Cr or Mn are known to increase the ductility of this material. In the present and a recent study we have used electron energy loss spectroscopy as a sensitive test to investigate the electronic structure in these materials. The near edge structure (NES) may give complementary information to e.g. convergent beam electron diffraction (CBED) about the bonding character in these materials.

EELS spectra were collected using a Gatan 666 spectrometer with parallel recording fitted to a Philips CM 30 transmission electron microscope operating at a nominal voltage of 150 kV. The energy resolution (measured as full width at half maximum) was typically around 1 eV. Spectra from areas of similar thickness, as measured relative to the total inelastic mean free path of the 150-keV electrons were obtained.

Type
Analytical Electron Microscopy
Information
Microscopy and Microanalysis , Volume 3 , Issue S2: Proceedings: Microscopy & Microanalysis '97, Microscopy Society of America 55th Annual Meeting, Microbeam Analysis Society 31st Annual Meeting, Histochemical Society 48th Annual Meeting, Cleveland, Ohio, August 10-14, 1997 , August 1997 , pp. 995 - 996
Copyright
Copyright © Microscopy Society of America 1997

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References

1.Lie, K.et al., EUREM 11, Dublin (1996).Google Scholar
2.Holmestad, R.et al., Phil. Mag. A 72, (1995) 579.10.1080/01418619508243787CrossRefGoogle Scholar
3.Boothroyd, C. B.et al., in Proc. of the 7th Int. Conf for Electron Microscopy edited by Peachey, L.O. and Williams, D.B. (San Francisco Press, San Francisco, 1990), Vol.2. p80Google Scholar
4.Egerton, R. F., EELS in the Electron Microscope (Plenum Press, New York, 1986).Google Scholar
5.Lie, K.et al., (1997) To be submitted.Google Scholar
6.The authors are grateful to the Norwegian Research Council for financial supportGoogle Scholar