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Electron-beam-stimulated Atomic Migration Processes in Single-layer MoTe2

Published online by Cambridge University Press:  30 July 2020

Janis Köster
Affiliation:
Ulm University, Ulm, Baden-Wurttemberg, Germany
Tibor Lehnert
Affiliation:
Ulm University, Ulm, Baden-Wurttemberg, Germany
Mahdi Ghorbani-Asl
Affiliation:
Helmholtz-Zentrum Dresden-Rossendorf, Dresden, Sachsen, Germany
Silvan Kretschmer
Affiliation:
Helmholtz-Zentrum Dresden-Rossendorf, Dresden, Sachsen, Germany
Hannu-Pekka Komsa
Affiliation:
Aalto University, Aalto, Uusimaa, Finland
Arkady Krasheninnikov
Affiliation:
Helmholtz-Zentrum Dresden-Rossendorf, Dresden, Sachsen, Germany
Ute Kaiser
Affiliation:
Ulm University, Ulm, Baden-Wurttemberg, Germany

Abstract

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Type
Structural Changes in Hard, Soft, and Biological Samples During Imaging: From Transmission Electron to Helium Ion Microscopy
Copyright
Copyright © Microscopy Society of America 2020

References

Chhowalla, Manish, et al. Nature chemistry 5.4 (2013): 26310.1038/nchem.1589CrossRefGoogle Scholar
Lin, Yen-Fu, et al. Advanced Materials 26.20 (2014): 3263326910.1002/adma.201305845CrossRefGoogle Scholar
Jiang, Juan, et al. Nature communications 8 (2017): 1397310.1038/ncomms13973CrossRefGoogle Scholar
Villegas, Cesar EP, and Rocha, A. R.. The Journal of Physical Chemistry C 119.21 (2015): 118861189510.1021/jp5122596CrossRefGoogle Scholar
Linck, M. et al. , Phys. Rev. Lett. 2016, 117, 07610110.1103/PhysRevLett.117.076101CrossRefGoogle Scholar
Lee, Z. et al. , Ultramicroscopy 2012, 112(1), 394610.1016/j.ultramic.2011.10.009CrossRefGoogle Scholar
Komsa, H.-P. et al. , Phys. Rev. Lett. 108 (2012) 196102Google Scholar
Kaiser, Ute, et al. Ultramicroscopy 111.8 (2011): 1239124610.1016/j.ultramic.2011.03.012CrossRefGoogle Scholar
Lehnert, T. et al. , ACS Appl. Nano. Mat. 2 (2019): 3262327010.1021/acsanm.9b00616CrossRefGoogle Scholar