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Electron-Beam Induced Activation of Catalyst Supports for CNT Growth

Published online by Cambridge University Press:  04 August 2017

Jennifer Carpena-Nunez ,
Benjamin Davis ,
Ahmad Ehteshamul Islam ,
Gordon Sargent ,
Neil Murphy ,
Tyson Back ,
Matthew Maschmann  and
Benji Maruyama
Jennifer Carpena-Nunez
Affiliation:
Materials and Manufacturing Directorate, Air Force Research Laboratory, Wright-Patterson Air Force Base, Dayton, Ohio National Research Council, Washington, DC
Benjamin Davis
Affiliation:
Department of Mechanical and Aerospace Engineering, University of Missouri, Columbia, MO
Ahmad Ehteshamul Islam
Affiliation:
Materials and Manufacturing Directorate, Air Force Research Laboratory, Wright-Patterson Air Force Base, Dayton, Ohio UES, Inc., Dayton, Ohio
Gordon Sargent
Affiliation:
Materials and Manufacturing Directorate, Air Force Research Laboratory, Wright-Patterson Air Force Base, Dayton, Ohio UES, Inc., Dayton, Ohio
Neil Murphy
Affiliation:
Materials and Manufacturing Directorate, Air Force Research Laboratory, Wright-Patterson Air Force Base, Dayton, Ohio
Tyson Back
Affiliation:
Materials and Manufacturing Directorate, Air Force Research Laboratory, Wright-Patterson Air Force Base, Dayton, Ohio UDRI, Inc., Dayton, Ohio
Matthew Maschmann
Affiliation:
Department of Mechanical and Aerospace Engineering, University of Missouri, Columbia, MO
Benji Maruyama
Affiliation:
Materials and Manufacturing Directorate, Air Force Research Laboratory, Wright-Patterson Air Force Base, Dayton, Ohio

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 23 , Supplement S1: Proceedings of Microscopy & Microanalysis 2017 , July 2017 , pp. 1932 - 1933
Copyright
© Microscopy Society of America 2017 

References

[1] Islam, A. E., et al, Nano Lett. 14 2014). p. 4997.Google Scholar
[2] Chen, Y., et al, Appl. Phys. Lett. 90 2007). p. 093126.Google Scholar
[3] Toyoda, N., Kimura, A. & Yamada, I. Nucl. Instr. Meth. Phys. Res. B 371 2016). p. 317.Google Scholar
[4] Egerton, R. F. Micron 35 2004). p. 399.CrossRefGoogle Scholar
[5] Egerton, R. F. Mic. Res. Technique 75 2012). p. 1550.CrossRefGoogle Scholar
[6] Pells, G. P. & Phillips, D. C. J. Nucl. Mater. 80 1979). p. 215.CrossRefGoogle Scholar
[7] Royall, C. P., Thiel, B.L. & Donald, A. M. J. Microscopy 204 2001). p. 185.Google Scholar
[8] Caer, S. L. Water 3 2011). p. 235.Google Scholar