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Electron Tomographic Characterization of Er doped SiC

Published online by Cambridge University Press:  07 September 2007

J Leschner ,
U Kaiser ,
J Biskupek ,
A Chuvilin  and
Ch Kübel
J Leschner
Affiliation:
University of Ulm, Germany
U Kaiser
Affiliation:
University of Ulm, Germany
J Biskupek
Affiliation:
University of Ulm, Germany
A Chuvilin
Affiliation:
University of Ulm, Germany
Ch Kübel
Affiliation:
Fraunhofer Institute for Manufacturing Technology and Applied Materials Science, Germany
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Extract

Extended abstract of a paper presented at MC 2007, 33rd DGE Conference in Saarbrücken, Germany, September 2 – September 7, 2007

Type
Research Article
Information
Microscopy and Microanalysis , Volume 13 , Issue S03 , September 2007 , pp. 116 - 117
Copyright
Copyright © Microscopy Society of America 2007

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