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Electron Microscopy to Probe Flat Band Topological Systems of 2D and Pseudo 2D Quantum Materials

Published online by Cambridge University Press:  30 July 2020

David Bell ,
Joe Checkelsky ,
Yumbo Ou ,
Jagadeesh Moodera ,
Riccardo Comin  and
Aravind Devarakonda
David Bell
Affiliation:
Harvard University, Cambridge, Massachusetts, United States
Joe Checkelsky
Affiliation:
Massachusetts Institute of Technology, Cambridge, Massachusetts, United States
Yumbo Ou
Affiliation:
Massachusetts Institute of Technology, Cambridge, Massachusetts, United States
Jagadeesh Moodera
Affiliation:
Massachusetts Institute of Technology, Cambridge, Massachusetts, United States
Riccardo Comin
Affiliation:
Massachusetts Institute of Technology, Cambridge, Massachusetts, United States
Aravind Devarakonda
Affiliation:
Massachusetts Institute of Technology, Cambridge, Massachusetts, United States

Abstract

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Type
New Frontiers in Electron Microscopy of Two-dimensional Materials
Information
Microscopy and Microanalysis , Volume 26 , Supplement S2 , August 2020 , pp. 2376 - 2377
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Copyright
Copyright © Microscopy Society of America 2020

References

Kang, et al. , Nature Materials 19, 163-169 (2019).10.1038/s41563-019-0531-0CrossRefGoogle Scholar
Ye, M. Kang, J. Liu, F. von Cube, C. R. Wicker, T. Suzuki, C Jozwiak, A. Bostwick, E. Rotenberg, D. C. Bell, L. Fu, R. Comin, and J. G. Checkelsky, , Nature 555, 638-642 March (2018).10.1038/nature25987CrossRefGoogle Scholar
This work was supported by the STC Center for Integrated Quantum Materials, NSF Grant No. DMR-1231319.Google Scholar