Hostname: page-component-848d4c4894-8bljj Total loading time: 0 Render date: 2024-06-26T10:09:16.120Z Has data issue: false hasContentIssue false
  • English
  • Français

Electron Microscopy Investigations of Doped ZnS Nanostructures

Published online by Cambridge University Press:  25 July 2016

C. Virgil Solomon  and
Jung-Il Hong
C. Virgil Solomon
Affiliation:
Department of Mechanical & Industrial Engineering, Youngstown State University, Youngstown, Ohio, USA
Jung-Il Hong
Affiliation:
Daegu Gyeongbuk Institute of Science & Technology, Daegu, Republic of Korea

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 22 , Supplement S3: Proceedings of Microscopy & Microanalysis 2016 , July 2016 , pp. 1646 - 1647
Copyright
© Microscopy Society of America 2016 

References

[1] Fang, X., et al., Critical Reviews in Solid State and Materials Sciences 34 (2009). p 190.Google Scholar
[2] Moore, D. & Wang, Z. Journal of Materials Chemistry 16 (2006). p. 3898.Google Scholar
[3] Yang, S., et al., Applied Physics Letters 100 (2012) 101907.CrossRefGoogle Scholar
[4] The authors acknowledge the use of Electron Microscopy Facility within the Center for Excellence in Materials Science and Engineering at YSU. The NSF, DMR 1229129 support is acknowledged.Google Scholar