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Electron Microscopy and Interface Plasmons Characterization of Cadmium Telluride Thin Film Grown Incommensurately with Weak Bonding on Sapphire

Published online by Cambridge University Press:  30 July 2020

Hesham El-Sherif ,
Stephen Jovanovic ,
John Preston  and
Nabil Basim
Hesham El-Sherif
Affiliation:
McMaster University, Hamilton, Ontario, Canada
Stephen Jovanovic
Affiliation:
McMaster University, Hamilton, Ontario, Canada
John Preston
Affiliation:
McMaster University, Hamilton, Ontario, Canada
Nabil Basim
Affiliation:
McMaster University, Hamilton, Ontario, Canada

Abstract

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Type
Pushing the Limits of Detection in Quantitative (S)TEM Imaging, EELS, and EDX
Information
Microscopy and Microanalysis , Volume 26 , Supplement S2 , August 2020 , pp. 3116 - 3118
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Copyright
Copyright © Microscopy Society of America 2020

References

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