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Electron Microscopy Advances for Studies of Catalysis at Atomic-Resolution and at Ambient Pressure Levels

Published online by Cambridge University Press:  23 September 2015

C. F. Elkjaer ,
S. B. Vendelbo ,
H. Falsig ,
I. Puspitasan ,
P. Dona ,
L. Mele ,
B. Morana ,
R. van Rijn ,
B. J. Nelissen  and
J. F. Creemer
...Show all authors
C. F. Elkjaer
Affiliation:
Haldor Topsoe A/S, Nymollevej 55, DK-2800 Kgs. Lyngby, Denmark CINF, Technical University of Denmark, Fysikvej building 307, 2800 Kgs. Lyngby, Denmark
S. B. Vendelbo
Affiliation:
Haldor Topsoe A/S, Nymollevej 55, DK-2800 Kgs. Lyngby, Denmark ChemE, Delft University of Technology, Julianalaan 136, 2628 BL Delft, The Netherlands
H. Falsig
Affiliation:
Haldor Topsoe A/S, Nymollevej 55, DK-2800 Kgs. Lyngby, Denmark
I. Puspitasan
Affiliation:
ChemE, Delft University of Technology, Julianalaan 136, 2628 BL Delft, The Netherlands
P. Dona
Affiliation:
FEI Company, Acthtseweg Noord 5, 5651 GG Eindhoven, The Netherlands
L. Mele
Affiliation:
FEI Company, Acthtseweg Noord 5, 5651 GG Eindhoven, The Netherlands
B. Morana
Affiliation:
DIMES-ECTM, Delft University of Technology, P.O. Box 5053, 2600 GB Delft, The Netherlands
R. van Rijn
Affiliation:
Leiden Probe Microscopy BV, Niels Bohrweg 2, 2333 CA Leiden, The Netherlands
B. J. Nelissen
Affiliation:
Albemarle Catalyst Company BV, P.O. Box 37650, 1030 BE Amsterdam, The Netherlands
J. F. Creemer
Affiliation:
DIMES-ECTM, Delft University of Technology, P.O. Box 5053, 2600 GB Delft, The Netherlands
Ib Chorkendorff
Affiliation:
CINF, Technical University of Denmark, Fysikvej building 307, 2800 Kgs. Lyngby, Denmark
P. J. Kooyman
Affiliation:
ChemE, Delft University of Technology, Julianalaan 136, 2628 BL Delft, The Netherlands
S. Helveg
Affiliation:
Haldor Topsoe A/S, Nymollevej 55, DK-2800 Kgs. Lyngby, Denmark

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 21 , Supplement S3: Proceedings of Microscopy & Microanalysis 2015 , August 2015 , pp. 419 - 420
Copyright
Copyright © Microscopy Society of America 2015 

References

[1] Creemer, J.F., et al, Proceedings: IEEE MEMS (2011). p. 1103–1106.Google Scholar
[2] Vendelbo, S.B., et al, Ultramicroscopy 133 (2013). p. 72–79.CrossRefGoogle Scholar
[3] Vendelbo, S.B., et al. Nature Materials 13 (2014). p. 884–890.CrossRefGoogle Scholar
[4] Jinschek, J.R. & Helveg, S., Micron 43 (2012). p. 1156–1168.CrossRefGoogle Scholar
[5] Helveg, S., Kisielowski, C.F., Jinschek, J.R., Specth, P., Yuan, G. & Frei, H., Micron 68 (2015) 176–185.CrossRefGoogle Scholar