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Electron Decelerator for Improved CCD Performance In Intermediate Voltage Electron Microscopy

Published online by Cambridge University Press:  02 July 2020

Kenneth H. Downing ,
Paola Favia  and
E. Mooney
Kenneth H. Downing
Affiliation:
Life Sciences Division, Lawrence Berkeley National Laboratory, Berkeley, CA94720
Paola Favia
Affiliation:
Gatan Inc., 5933 Coronado Lane, Pleasanton, CA94588
E. Mooney
Affiliation:
Gatan Inc., 5933 Coronado Lane, Pleasanton, CA94588
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Extract

There are many advantages of IVEMs over more conventional microscopes, all of which make it possible to obtain more accurate data at higher resolution. One significant drawback of higher accelerating voltages is degraded performance of the electron detector, a problem that is particularly serious with CCD cameras. At any voltage, one faces a tradeoff with the CCD performance between sensitivity and resolution. Electron scattering within the scintillator and its support broaden the point spread function, while the decreased scattering cross section at higher voltages decreases the light output from the scintillator. At voltages much above 100 kV these effects have been found to seriously limit CCD performance. With the trend towards electronic data collection and microscope automation, it is essential that a high performance detector be developed for the IVEM. One approach to optimizing the performance tradeoff employs lens coupling to improve resolution, at the expense of sensitivity.

Type
New Detectors—Benefits and Drawbacks
Information
Microscopy and Microanalysis , Volume 6 , Issue S2: Proceedings: Microscopy & Microanalysis 2000, Microscopy Society of America 58th Annual Meeting, Microbeam Analysis Society 34th Annual Meeting, Microscopical Society of Canada/Societe de Microscopie de Canada 27th Annual Meeting, Philadelphia, Pennsylvania August 13-17, 2000 , August 2000 , pp. 734 - 735
Copyright
Copyright © Microscopy Society of America

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References

References:

1.Downing, K.H. and Hendrickson, F.M., Performance of a 2k CCD camera designed for electron crystallography at 400 kV. Ultramicroscopy 75 215–233 (1999).CrossRefGoogle ScholarPubMed
2.Meyer, R.R. and Kirkland, A., The effects of electron and photon scattering on signal and noise transfer properties of scintillators in CCD cameras used for electron detection. Ultramicroscopy 75 23–33 (1998).CrossRefGoogle Scholar
3. For a detailed description and references, see P. Favia et al. in this volume.Google Scholar