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Electron Crystallography in the Age of Pixelated Detectors: From Crystalline/Amorphous Organic Structural Models and Phase Mapping of Beam Sensitive Materials

Published online by Cambridge University Press:  05 August 2019

S Nicolopoulos ,
A Gomez  and
PP Das
S Nicolopoulos*
Affiliation:
NanoMEGAS SPRL, Brussels, Belgium.
A Gomez
Affiliation:
NanoMEGAS SPRL, Brussels, Belgium.
PP Das
Affiliation:
NanoMEGAS SPRL, Brussels, Belgium.
*
*Corresponding author: info@nanomegas.com

Abstract

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Type
Electron Crystallography of Nano-structures in Nanotechnology, Materials and Bio-Sciences
Information
Microscopy and Microanalysis , Volume 25 , Supplement S2 , August 2019 , pp. 1948 - 1949
Copyright
Copyright © Microscopy Society of America 2019 

References

[1]Jiang, Y et al. , Nature 559 (2018), p. 343.Google Scholar
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[3]Vincent, R and Midgley, PA, Ultramicroscopy 53 (1994), p. 271.Google Scholar
[4]Das, PP et al. , Org. Process Res. Dev. 22 (2018), p. 1365.Google Scholar
[5]Rauch, EF et al. , Zeit fur Krist, 225 (2010), p. 103.Google Scholar