Hostname: page-component-7479d7b7d-767nl Total loading time: 0 Render date: 2024-07-10T18:27:23.396Z Has data issue: false hasContentIssue false
  • English
  • Français

EFTEM at High Magnification: Principles and Practical Applications

Published online by Cambridge University Press:  01 November 2002

Werner Grogger ,
Kannan M. Krishnan  and
Ferdinand Hofer
Werner Grogger
Affiliation:
Research Institute for Electron Microscopy, Graz University of Technology, Steyrergasse 17, A-8010 Graz, Austria
Kannan M. Krishnan
Affiliation:
NCEM, Materials Sciences Div., Lawrence Berkeley National Lab., Berkeley, CA 94720, USA
Ferdinand Hofer
Affiliation:
Research Institute for Electron Microscopy, Graz University of Technology, Steyrergasse 17, A-8010 Graz, Austria

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 8 , Issue S02 , August 2002 , pp. 72 - 73
Copyright
Copyright © Microscopy Society of America 2002