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Efficient Simulation of Secondary Fluorescence Via NIST DTSA-II Monte Carlo

Published online by Cambridge University Press:  13 March 2017

Nicholas W. M. Ritchie
Nicholas W. M. Ritchie*
Affiliation:
National Institute of Standards and Technology, 100 Bureau Drive, Gaithersburg, MD 20899-8372, USA
*
*Corresponding author. nicholas.ritchie@nist.gov
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Abstract

Secondary fluorescence, the final term in the familiar matrix correction triumvirate Z·A·F, is the most challenging for Monte Carlo models to simulate. In fact, only two implementations of Monte Carlo models commonly used to simulate electron probe X-ray spectra can calculate secondary fluorescence—PENEPMA and NIST DTSA-IIa (DTSA-II is discussed herein). These two models share many physical models but there are some important differences in the way each implements X-ray emission including secondary fluorescence. PENEPMA is based on PENELOPE, a general purpose software package for simulation of both relativistic and subrelativistic electron/positron interactions with matter. On the other hand, NIST DTSA-II was designed exclusively for simulation of X-ray spectra generated by subrelativistic electrons. NIST DTSA-II uses variance reduction techniques unsuited to general purpose code. These optimizations help NIST DTSA-II to be orders of magnitude more computationally efficient while retaining detector position sensitivity. Simulations execute in minutes rather than hours and can model differences that result from detector position. Both PENEPMA and NIST DTSA-II are capable of handling complex sample geometries and we will demonstrate that both are of similar accuracy when modeling experimental secondary fluorescence data from the literature.

Keywords

Monte CarloX-raysecondary fluorescenceEPMASEM-EDS
Type
Instrumentation and Software
Information
Microscopy and Microanalysis , Volume 23 , Issue 3 , June 2017 , pp. 618 - 633
Copyright
© Microscopy Society of America 2017 

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